Byun, Jay Hoon
Introduction
Jay Hoon Byun is a Foreign Attorney with Yulchon’s Intellectual Property (IP) Group. Mr. Byun advises both domestic and foreign multinational corporations on various aspects of intellectual property law, particularly in matters involving international IP disputes, IP management, technology licensing, and technology due diligence. Mr. Byun graduated summa cum laude from Seoul National University with a B.S. in Computer Engineering, and obtained his J.D. degree from University of Southern California School of Law. Prior to joining Yulchon, Mr. Byun worked as an associate attorney at the AmLaw 100 firm of Haynes and Boone, LLP, where he assisted clients of all sizes from small start-ups to large multinational tech companies in resolving IP disputes and protecting their IP rights.
- 2011 USC Gould School of Law, Los Angeles, CA, J.D.
- 2007 University of Illinois at Urbana-Champaign, Urbana, IL, completed Ph.D. coursework and qualification exam in Computer Science
- 1996 The 32nd Higher Civil Service Examination in Technology
- 1995 Seoul National University, B.S. in Computer Engineering (summa cum laude)
- 2017–present Yulchon LLC
- 2011–2017 Associate, Haynes and Boone, LLP, Orange County, CA
- 1999-2001 Visiting Researcher, University of California, San Diego, CA
- 2011 Admitted to Bar , California
- 2014 Patent Attorney , U.S. Patent and Trademark Office
Korean, English
Awards/Recognition
- 2022-2026 Silver, IP Litigation, IAM Patent 1000
Speech/Presentation
- Dec. 2019 Discovery in U.S. Litigation, IP Seminar for HMC Affiiates, Yulchon, LLC
- Nov. 2019 The Case for Hiring a Local Korean Firm for U.S. Lawsuits, International Section Workshop, Korea Intellectual Property Association (KINPA)
- Nov. 2019 Enhanced Damages in U.S. Patent Litigation, IP Community Seminar, Seoul Bar Association
- Feb. 2019 Willful Infringement and Enhanced Damages in U.S. Patent Litigation, International Section Workshop, Korea Intellectual Property Association (KINPA)
